SECTION 252:410-11-76. Spot-checks  


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  • (a)   Required. Spot-checks must be performed on therapeutic systems which are capable of operation at greater than 150 kVp.
    (b)   Procedure. Written spot-check procedures must be developed by a radiological physicist which:
    (1)   state the frequency at which tests or measurements are to be performed;
    (2)   set the acceptable tolerance for each parameter measured in the spot-check when compared to the value for that parameter determined in the calibration;
    (3)   include special operating instructions to be used when a parameter measured in the spot-check exceeds an acceptable tolerance level of the value for that parameter which was determined in the calibration.
    (4)   require that spot-checks be performed during calibration.
    (c)   Performance and review. Each spot-check must be performed by or under the direction of a radiological physicist according to the written spot-check procedures. When a spot-check is performed by someone other than a radiological physicist, the physicist must review the resulting measurements and record his review. The review must occur within ten (10) treatment days.
    (d)   Additional frequency requirements. Systems of 1 MeV or more must have:
    (1)   spot-checks performed during calibrations and thereafter at intervals not to exceed one month;
    (2)   a spot-check of system output performed each day before any patient is treated; and
    (3)   a spot-check of absorbed dose measurements taken at a minimum of two (2) depths in a phantom at intervals not to exceed one (1) month.
    (e)   Measurements. A spot-check record must state the acceptable tolerance for each parameter measured in the spot-check when compared to the value for that parameter determined in the calibration.
    (1)   Whenever a spot-check indicates a significant change in the operating characteristics of a system, as specified in the spot-check procedures, the system must be recalibrated.
    (2)   When a spot-check involves a radiation measurement, such measurement shall be obtained using a system satisfying the requirements of 252:410-11-73(b) or which has been intercompared with a system meeting those requirements within the previous year.
    (f)   Measurement restriction. For systems of 1 MeV or more, any built-in devices which provide a measurement of any parameter during irradiation cannot be utilized for spot-check measurements.
[Source: Added at 17 Ok Reg 1136, eff 6-1-00]